XIA Haoxuan, LIU Zixu, WANG Jingqin, YANG Chunwen, WANG Li. Reliability growth prediction of mine-used low-voltage switchgearJ. Journal of Mine Automation, 2015, 41(2): 36-39. DOI: 10.13272/j.issn.1671-251x.2015.02.010
Citation: XIA Haoxuan, LIU Zixu, WANG Jingqin, YANG Chunwen, WANG Li. Reliability growth prediction of mine-used low-voltage switchgearJ. Journal of Mine Automation, 2015, 41(2): 36-39. DOI: 10.13272/j.issn.1671-251x.2015.02.010

Reliability growth prediction of mine-used low-voltage switchgear

  • A mine low-voltage switchgear was taken as object to study its reliability growth process in the commissioning phase in underground coal mine. It was clarified that number of mine-used low-voltage switchgear failure occurrence accompanied with repair obeys non-homogeneous Poisson process according to Laplace hypothesis-testing theory and Bayes theory. The Bayes point and interval estimations for mean time between failures and failure intensity of synchronous time were presented taking the non-information priori distribution, and the actual data obtained in the commissioning phase was used to predict mean time between failures of the mine-used low-voltage switchgear to verify effectiveness of Bayes methods, which provided basis for finding of safety loophole of the switchgear.
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