XIA Haoxuan, LIU Zixu, WANG Jingqin, et al. Reliability growth prediction of mine-used low-voltage switchgear[J]. Industry and Mine Automation, 2015, 41(2): 36-39. doi: 10.13272/j.issn.1671-251x.2015.02.010
Citation: XIA Haoxuan, LIU Zixu, WANG Jingqin, et al. Reliability growth prediction of mine-used low-voltage switchgear[J]. Industry and Mine Automation, 2015, 41(2): 36-39. doi: 10.13272/j.issn.1671-251x.2015.02.010

Reliability growth prediction of mine-used low-voltage switchgear

doi: 10.13272/j.issn.1671-251x.2015.02.010
  • Publish Date: 2015-02-10
  • A mine low-voltage switchgear was taken as object to study its reliability growth process in the commissioning phase in underground coal mine. It was clarified that number of mine-used low-voltage switchgear failure occurrence accompanied with repair obeys non-homogeneous Poisson process according to Laplace hypothesis-testing theory and Bayes theory. The Bayes point and interval estimations for mean time between failures and failure intensity of synchronous time were presented taking the non-information priori distribution, and the actual data obtained in the commissioning phase was used to predict mean time between failures of the mine-used low-voltage switchgear to verify effectiveness of Bayes methods, which provided basis for finding of safety loophole of the switchgear.

     

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      沈阳化工大学材料科学与工程学院 沈阳 110142

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